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Last edited by RenameBot
September 5, 2008 | History
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John Albers

12 works Add another?

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  • Cover of: Version 2.0 of the TXYZ thermal analysis program, TXYZ20

    First published in 1992 8 editions in 1 language
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  • Cover of: Results of the Monte Carlo calculation of one-and two-dimensional distributions of particles and damage: ion implanteddopants in silicon.

    First published in 1987 2 editions in 1 language
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  • Cover of: Semiconductor measurement technology: a collection of computer programs two-probe resistance (spreading resistance) and four-probe resistance calculations, RESPAC

    First published in 1993 2 editions in 1 language
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  • Cover of: Kidnapped: The Phalanx Blood Series Part I

    First published in 2017 1 edition in 1 language
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  • Cover of: Over a Barrel: The Phalanx Blood Series Part II

    First published in 2017 1 edition in 1 language
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  • Cover of: Phalanx Blood: Volumes 1-4

    First published in 2019 1 edition in 1 language
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  • Cover of: The Destructive bond pull test

    First published in 1976 1 edition in 1 language
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  • Cover of: A collection of computer programs two-probe resistance (spreading resistance) and four-probe resistance calculations, RESPAC

    First published in 1993 1 edition in 1 language
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  • Cover of: HOTPAC: programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML

    First published in 1995 1 edition in 1 language
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  • Cover of: HOTPAC, programs for thermal analysis including version 3.0 of the TXYZ program, TXYZ 30, and the thermal multilayer program, TML

    First published in 1995 1 edition in 1 language
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  • Cover of: TXYZ: a program for semiconductor IC thermal analysis.

    First published in 1984 1 edition in 1 language
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  • Cover of: TXYZ, a program for semiconductor IC thermal analysis

    First published in 1984 1 edition in 1 language
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Subjects
Semiconductors, Computer programs, Data processing, Thermal analysis, Thermal properties, Electric resistance, Spreading, Fourier analysis, Spreading Electric resistance, Aluminum wire, Bonding, Computer simulation, Integrated circuits, Ion implantation, Mathematical models, Monte Carlo method, Semiconductor doping, Testing

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ID Numbers

  • OLID: OL331102A

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History

Download catalog record: RDF / JSON
September 5, 2008 Edited by RenameBot fix author name
April 1, 2008 Created by an anonymous user initial import