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Last edited anonymously
April 30, 2008 | History
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Michael T. Postek

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19 works Add another?

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  • Cover of: Integrated circuit metrology, inspection, and process control VII: 2-4 March 1993, San Jose California

    First published in 1993 3 editions in 1 language
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  • Cover of: Critical Issues in Scanning Electron Microscope Metrology: September-October 1994

    First published in 1994 1 edition in 1 language
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  • Cover of: Integrated Circuit Metrology, Inspection, and Process Control VI: 9-11 March 1992 San Jose, California (Proceedings of S P I E)

    First published in 1992 1 edition in 1 language
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  • Cover of: Scanning electron microscopy: a student's handbook

    First published in 1980 1 edition in 1 language
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  • Cover of: Instrumentation, metrology, and standards for nanomanufacturing, optics, and semiconductors V: 24-25 August 2011, San Diego, California, United States

    First published in 2011 1 edition in 1 language
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  • Cover of: Microlithography and metrology in micromachining II: 14-15 October, 1996, Austin, Texas

    First published in 1996 1 edition in 1 language
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  • Cover of: Nanostructure science, metrology, and technology: 5-7 September 2001, Gaithersburg, USA

    First published in 2002 1 edition in 1 language — 1 previewable
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  • Cover of: Scanning Microscopies 2015

    First published in 2015 1 edition in 1 language
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  • Cover of: Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences

    First published in 2012 1 edition in 1 language
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  • Cover of: Scanning microscopy 2009: 4-7 May 2009, Monterey, California, United States

    First published in 2009 1 edition in 1 language
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  • Cover of: Instrumentation, metrology, and standards for nanomanufacturing II: 10 August 2008, San Diego, California, USA

    First published in 2008 1 edition in 1 language
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  • Cover of: Scanning microscopy 2010: 17-19 May 2010, Monterey, California, United States

    First published in 2010 1 edition in 1 language
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  • Cover of: Microlithography and metrology in micromachining: 23-24 October, 1995, Austin, Texas

    First published in 1995 1 edition in 1 language — 1 previewable
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  • Cover of: Scanning microscopies 2011: advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences ; 26-28 April 2011, Orlando, Florida, United States

    First published in 2011 1 edition in 1 language
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  • Cover of: Instrumentation, metrology, and standards for nanomanufacturing IV: 2-4 August 2010, San Diego, California, United States

    First published in 2010 1 edition in 1 language
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  • Cover of: Scanning microscopy 2009: 4-7 May 2009, Monterey, California, United States

    First published in 2009 1 edition in 1 language
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  • Cover of: Instrumentation, metrology, and standards for nanomanufacturing III: 3-5 August 2009, San Diego, California, United States

    First published in 2009 1 edition in 1 language
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  • Cover of: Instrumentation, metrology, and standards for nanomanufacturing III: 3-5 August 2009, San Diego, California, United States

    First published in 2009 1 edition in 1 language
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  • Cover of: New research in nanotechnology

    First published in 2011 1 edition in 1 language
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We need a photo of Michael T. Postek

Subjects
Congresses, Nanotechnology, Scanning electron microscopes, Microfabrication, Nanostructured materials, Measurement, Mensuration, Nanomanufacturing, Integrated circuits, Microlithography, Micromachining, Process control, Inspection, Metrology, Microelectronics, Micromechanics, Nanostructures

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ID Numbers

  • OLID: OL3545047A

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History

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April 30, 2008 Created by an anonymous user initial import