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Last edited by RenameBot
September 2, 2008 | History
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Manoj Sachdev

7 works Add another?

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  • Cover of: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

    First published in 2007 3 editions in 1 language — 1 previewable
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  • Cover of: Defect oriented testing for CMOS analog and digital circuits

    First published in 1998 2 editions in 1 language — 1 previewable
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  • Cover of: 2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada : Proceedings

    First published in 2000 2 editions in 1 language
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  • Cover of: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

    First published in 2010 1 edition in 1 language
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  • Cover of: Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)

    First published in 2006 1 edition
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  • Cover of: Thermal and Power Management of Integrated Circuits

    First published in 2010 1 edition
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  • Cover of: Thermal and Power Management of Integrated Circuits (Series on Integrated Circuits and Systems)

    First published in 2006 1 edition in 1 language — 1 previewable
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Subjects
Integrated circuits, Complementary Metal oxide semiconductors, Defects, Metal oxide semiconductors, Complementary, Metal oxide semiconductors, complementary, Testing, CMOS, CMOS-Schaltung, Computer Books: General, Computer Engineering, Computer engineering, Computer storage devices, Computer-aided design, Computers, Congresses, Digital Computer Hardware, Digital integrated circuits, Electronics, Electronics engineering, Engineering, Engineering design, General, INTEGRATED CIRCUITS, Iddq testing, Integrated circuits, very large scale integration

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ID Numbers

  • OLID: OL398968A

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History

Download catalog record: RDF / JSON
September 2, 2008 Edited by RenameBot fix author name
April 1, 2008 Created by an anonymous user initial import