It looks like you're offline.
Donate
Change Website Language
Open Library logo
additional options menu
Last edited by RenameBot
August 29, 2008 | History
Edit

A. Christou

We need a photo of A. Christou

9 works Add another?

Sorting by Sorted by: Most Editions | First Published | Most Recent | Top Rated | Reading Log | Random

Showing all works by author. Would you like to see only ebooks?

  • Cover of: Semiconductor Device Reliability

    First published in 1989 2 editions in 1 language — 1 previewable
    Not in Library

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
  • Cover of: Electromigration and electronic device degradation

    First published in 1994 1 edition in 1 language — 1 previewable
    Preview Only

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
  • Cover of: Reliability of gallium arsenide MMICs

    First published in 1992 1 edition in 1 language
    Not in Library

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
  • Cover of: Automated scanning low-energy electron probe (ASLEEP) for semiconductor wafer diagnostics

    First published in 1978 1 edition in 1 language
    Not in Library

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
  • Cover of: Gallium Arsenide and Related Compounds, 1987 (International Symposium on Gallium Arsenide and Related Compounds// Papers)

    First published in 1988 1 edition in 1 language — 1 previewable
    Borrow Listen

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
  • Cover of: Integrating Quality and Reliability into Microelectronics Manufacturing (Design and Measurement in Electronic Engineering)

    First published in 1995 1 edition
    Not in Library

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
  • Cover of: Integrating reliability into microelectronics manufacturing

    First published in 1994 1 edition in 1 language
    Not in Library

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
  • Cover of: Reliability of high temperature electronics

    First published in 1996 1 edition in 1 language
    Not in Library

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
  • Cover of: Reliability of Gallium Arsenide Monolithic Microwave Integrated Circuits

    First published in 1995 1 edition in 1 language — 1 previewable
    Preview Only

    My Reading Lists:

    Create a new list

    Check-In

    ×Close
    Add an optional check-in date. Check-in dates are used to track yearly reading goals.
    Today
We need a photo of A. Christou

Subjects
Integrated circuits, Reliability, Microwave integrated circuits, Semiconductors, Testing, Deterioration, Electrodiffusion, Electronic circuits, Failures, Gallium arsenide semiconductors, Microelectronics, Probes (Electronic instruments), Quality control, Reliability (engineering), Semiconductor wafers, Thermal properties, Transistors

Lists

Add to List

My Reading Lists:

Create a new list

ID Numbers

  • OLID: OL550182A

Links (outside Open Library)

No links yet. Add one?

History

Download catalog record: RDF / JSON
August 29, 2008 Edited by RenameBot fix author name
April 1, 2008 Created by an anonymous user initial import