| Record ID | ia:xrayanalysispape00parr |
| Source | Internet Archive |
| Download MARC XML | https://archive.org/download/xrayanalysispape00parr/xrayanalysispape00parr_marc.xml |
| Download MARC binary | https://www.archive.org/download/xrayanalysispape00parr/xrayanalysispape00parr_meta.mrc |
LEADER: 01257cam 2200313I 4500
001 ocm01543309
003 OCoLC
005 20100114191835.0
008 750813s1965 xx 000 0 eng d
040 $aYWM$cYWM$dUBA$dOCLCG$dGIM
035 $a(OCoLC)1543309
050 14 $aQD945$b.P37 1965
100 1 $aParrish, William,$d1914-$eed.
245 10 $aX-ray analysis papers;$ca volume of twenty-four selected reprints from Philips Laboratories, Briarcliff Manor, New York, U.S.A.
250 $a[2d ed.]
260 $aEindhoven,$bCentrex Pub. Co.,$cc1965.
300 $a311 p.$billus.$c28 cm.
500 $aSecond edition of Advances in X-ray diffractometry and X-ray spectrography.
650 0 $aX-ray crystallography.
650 7 $aCristalografia De Raios X$2larpcal
650 7 $aEspectroscopia De Raios X$2larpcal
952 $a1543309$zYWM$bUS MIL ACAD$hFull OCLC member$iLCC$u20091220
952 $a131595768$zYUS$bYALE UNIV LIBR$hFull$u20070518
952 $a263022548$zCUD$bCAMBRIDGE UNIV$hFull OCLC member$u20081021
952 $a263022550$zCUD$bCAMBRIDGE UNIV$hFull OCLC member$u20081021
952 $a469269951$zTEU$bTEMPLE UNIV$hOther$u20091124
029 1 $aZWZ$b016736060
994 $aZ0$bPMR
948 $hNO HOLDINGS IN PMR - 84 OTHER HOLDINGS