| Record ID | marc_laurentian/openlibrary.mrc:106227268:865 |
| Source | The Laurentian Library |
| Download Link | /show-records/marc_laurentian/openlibrary.mrc:106227268:865?format=raw |
LEADER: 00865nam 2200217 a 4500
001 01-0131756
005 19991211182720.0
008 970701s1965 ne a u000 0 eng u
035 $a(Sirsi) a111140
050 00 $aQD'945'P3'1965
100 1 $aParrish, William,$d1914-
245 00 $aX-ray analysis papers :$ba volume of twenty-four selected reprints from Philips Laboratoires, Briarcliff Manor, New York, U.S.A. /$cedited by William Parrish
260 $aEindhoven :$bCentrex Pub. Co,$c1965.
300 $a311 p. :$bill.
500 $aSecond edition of Advances in X-ray diffractometry and X-ray spectrography.
650 0 $aX-ray crystallography.
659 $aer9205
659 $amb
949 $aQD 945 P3 1965$wLC$i30007004397211$rY$tBOOKS$lDESM-CIR$mDESMARAIS
596 $a1
999 $aQD 945 P3 1965$wLC$c1$i30007004397211$lDESM-CIR$mDESMARAIS$rY$sY$tBOOKS$u12/6/2003