An edition of X-ray diffraction at elevated temperatures (1993)

X-ray diffraction at elevated temperatures

a method for in situ process analysis

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Cover of: X-ray diffraction at elevated temperatures by D.D.L. Chung ... [et al.].
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Last edited by ImportBot
October 18, 2022 | History
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An edition of X-ray diffraction at elevated temperatures (1993)

X-ray diffraction at elevated temperatures

a method for in situ process analysis

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

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Publish Date
Publisher
VCH
Language
English
Pages
268

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Subjects
X-rays, Diffraction, Industrial applications, X-rays, diffraction, X-rays, industrial applications

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Edition Availability
Cover of: X-ray diffraction at elevated temperatures
X-ray diffraction at elevated temperatures: a method for in situ process analysis
1993, VCH
in English
  • Not in Library
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographical references and index.

Published in
New York

Classifications

Dewey Decimal Class
548/.83
Library of Congress
QC482.D5 X74 1993, QC482.D5.X74 1993

The Physical Object

Pagination
viii, 268 p. :
Number of pages
268

ID Numbers

Open Library
OL1718984M
ISBN 10
0895737450, 3527278427
LCCN
92021803
Goodreads
4920340

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History

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October 18, 2022 Edited by ImportBot import existing book
March 11, 2019 Created by MARC Bot import existing book