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Subjects
Design and construction, Integrated circuits, Metallic films, Metallizing, Very large scale integration, Computer simulation, Congresses, Engineering, Metal oxide semiconductor field-effect transistors, Metal oxide semiconductors, Models and modelmaking, Reliability, Semiconductors, Simulation methods, Systems engineering, Testing, Vapor-platingID Numbers
- OLID: OL7208295A
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July 29, 2014 | Created by ImportBot | import new book |