An edition of Lithography process control (1999)

Lithography process control

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Cover of: Lithography process control by Harry J. Levinson
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Last edited by Scott365Bot
October 22, 2023 | History
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An edition of Lithography process control (1999)

Lithography process control

by

  • 0 Ratings
  • 0 Want to read
  • 0 Currently reading
  • 0 Have read

x, 190 p. : 26 cm

Publish Date
Publisher
SPIE Optical Engineering Press
Language
English
Pages
190

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Previews available in: English

Subjects
Semiconductors, Quality control, Etching, Microlithography, Semi-conducteurs, Attaque chimique, Microlithographie, Qualité, Contrôle, TECHNOLOGY & ENGINEERING, Mechanical, Lithografie, Statistische Prozesslenkung, Commande de processus, Semiconducteurs, Lithographie (Halbleitertechnologie), Semiconductors -- Etching, Microlithography -- Quality control

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Edition Availability
Cover of: Lithography process control
Lithography process control
1999, SPIE Optical Engineering Press
in English
Libraries near you: WorldCat
Cover of: Lithography Process Control
Lithography Process Control
1999, SPIE
in English
Libraries near you: WorldCat

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Book Details

Edition Notes

Includes bibliographical references (p. 169-188) and index.

Published in
Bellingham, Wash
Series
Tutorial texts in optical engineering ;, v. TT 28

Classifications

Dewey Decimal Class
621.3815/2
Library of Congress
TK7871.85 .L464 1999, TK7871.85.L464 1999, TK7871.85 .L464 1999eb

The Physical Object

Pagination
x, 190 p. :
Number of pages
190

ID Numbers

Open Library
OL382069M
Internet Archive
lithographyproce0000levi
ISBN 10
0819430528
LCCN
98044433
OCLC/WorldCat
697188897
Goodreads
1579467

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History

Download catalog record: RDF / JSON / OPDS | Wikipedia citation
October 22, 2023 Edited by Scott365Bot import existing book
September 30, 2023 Edited by Scott365Bot Linking back to Internet Archive.
January 4, 2023 Edited by MARC Bot import existing book
December 18, 2022 Edited by MARC Bot import existing book
April 1, 2008 Created by an anonymous user Imported from Scriblio MARC record.